Document Type

Thesis - University Access Only

Award Date


Degree Name

Master of Science (MS)

Department / School

Electrical Engineering


The dielectric measurements used for characterizing piezoelectric, ferroelectric or electrostrictive materials sometimes requires the application of a high bias voltage (in the range of kV). However, occasional dielectric breakdown of the sample material causes the entire bias voltage to appear across the measuring instrument whose voltage limit is much smaller (typically several hundred volts) and consequently may damage it permanently. Therefore, a reliable and dependable high voltage terminal protection device was designed and implemented successfully in the EE department's dielectric measurement system at SDSU. The fixtures and cabling of the additional high voltage protection circuitry can affect the measurement results by introducing errors in the form of series resistance, series inductance, parallel capacitance, and parallel resistance. The effects of these error factors on the dielectric measurement results were studied by analyzing them both qualitatively and quantitatively. The results of the error analysis have been useful in applying to the characterization of lossy ferroelectric materials at SDSU.

Library of Congress Subject Headings

Dielectric measurements


Composite materials -- Electric properties

High voltages



Number of Pages



South Dakota State University